ലാബ്മേറ്റ് LMAFM-A101 ആറ്റോമിക് ഫോഴ്സ് മൈക്രോസ്കോപ്പ് ഇൻസ്ട്രക്ഷൻ മാനുവൽ

ഹാർഡ്‌വെയർ ഇൻസ്റ്റാളേഷൻ
This product requires a stable worktable to avoid vibrations and electromagnetic interference. Connect all hardware components as shown in the manual.

സോഫ്റ്റ്വെയർ ഇൻസ്റ്റാളേഷൻ
Insert the software CD, install the software driver, AFM operation software, and offline software following the provided instructions.

പ്രവർത്തനങ്ങൾ

Tapping AFM Operation Methods

Turn on the main power of AFM.
Open the TAFM file and enter tapping mode AFM software interface.

Choose the scan resolution (usually 256).
Adjust the laser and position-sensitive detector as per instructions.

www.labmate.com | info@labmate.com

സുരക്ഷാ നടപടികൾ

To obtain a better image, kindly equip a professional vibration isolation device.
Do not move or touch the system when it is working.

Do not suddenly prohibit when working.
Do not leave it working in strong radio waves or rays surrounding.
An electromagnetic field at a certain frequency may affect the image scanned.

This system needs to be grounded.

ആമുഖം

Atomic Force Microscope LMAFM-A101 offers 50μm×50μm XY scan range. It combines optical metallographic and atomic force microscopy for simultaneous dual-mode imaging. Equipped with 2D optical and 3D atomic force measurement with strong anti-interference structure. Integrated laser head and scanning stage ensure stable performance with nanometer-level nonlinear correction. Our Microscope is ideal for high-resolution surface analysis in nanotechnology and material science.

ഫീച്ചറുകൾ

Smart probe protection
Ultra-high magnification
Easy laser alignment

സ്പെസിഫിക്കേഷനുകൾ

മോഡൽ നമ്പർ	LMAFM-A101
ഓപ്പറേഷൻ മോഡ്	Contact Mode, Tapping Mode, Friction Mode, Phase Mode, Magnetic Mode, Electrostatic Mode
വളവുകൾ	RMS-Z Curve, F-Z Force Curve
XY Scan Range	50 × 50 μm
XY Scan Resolution	0.2 എൻഎം
Z Scan Range	5 മൈക്രോമീറ്റർ
Z Scan Resolution	0.05 എൻഎം
സ്കാൻ വേഗത	0.6Hz മുതൽ 30Hz വരെ
ആംഗിൾ സ്കാൻ ചെയ്യുക	0° മുതൽ 360° വരെ
Sample Size Capacity	Diameter less than or equal to 90 mm, Height less than or Equal to 20 mm
XY എസ്tagഇ പ്രസ്ഥാനം	25 × 25 μm
Shock-Absorbing Design	Spring Suspension, Metal Shielding Box
ഔട്ട്പുട്ട് ഇൻ്റർഫേസ്	USB 2.0 / 3.0
സോഫ്റ്റ്വെയർ അനുയോജ്യത	Windows XP/7/8/10

അപേക്ഷകൾ

Atomic Force Microscope LMAFM-A101 supports nanometer-level imaging of graphite, gold clusters, polystyrene spheres, and polysaccharides.

ഉപകരണ ആമുഖം

ഇൻസ്റ്റലേഷൻ

ഹാർഡ്‌വെയർ ഇൻസ്റ്റാളേഷൻ

This product is a nano-precision measuring instrument, requires a good environment. Kindly place the instrument on a stable worktable to avoid strong vibrations and large electromagnetic interference. After preparing all the components, connect each hardware unit as shown in Figure 2.

സോഫ്റ്റ്വെയർ ഇൻസ്റ്റാളേഷൻ

After the hardware is installed, put the software CD into the computer and open it. The User can find an instruction manual, AFM online software, software drivers, offline software, and a manual for offline software.

Install the software driver
Before the User installs the driver, kindly confirm the operating system type. If the PC is a 32-bit operating system, install the CD that came with “FT232RL driven -32 bit” and enter the folder, double-click the “ftdi_ft232_drive.exe”, follow the instructions to the next steps until it is finished. Then switch on the main power on the control panel, PC will install the driver automatically; If the PC is
64- bit operating system, copy the file “FT232RL driven -64 bit” of the CD to PC and then open the instrument main power switch, PC automatically install the driver until the prompt displays the installation is complete.
After the driver installed, identity the COM port used by the USB-to-Serail converter: right click “my computer”- property – Device Manager – COM LPT Ports, Check the “USB Serial Port( COM **), where “**” stands for the port number, if the COM Port used is not in the range of 1-10, kindly reset the COM Port following steps in below.
ഘട്ടം 1: Right-click on the “USB Serial Port” entry. In the pop-up menu, select the “Properties” entry. Shown in Figure 3.ഘട്ടം 2: In the “Port Settings” page, select the “Advanced” icon, shown in Figure 4.ഘട്ടം 3: In the new dialog, the User can select a different port, usually COM3, shown in Figure-5. Close all dialogs by clicking “OK”.
Install the AFM Operation Software
പകർത്തുക file “AFM software” to the PC, then open the file “TAFM” to delete the configuration document “TAFM.ini”. Double-click the “TAFM.EXE” to open it and operate. The contact mode AFM software is installed and opened in the same way as the tapping mode one.

Offline Software Installation
Open the offline software file on the CD, double click “ WSxM.exe” to install it, following the instructions until it is finished.

പ്രവർത്തനങ്ങൾ

Tapping AFM operation methods

ഘട്ടം 1: Turn on the main power of AFM, then open the “TAFM” file, double click “TAFM.exe” to enter tapping mode AFM software interface.

ഘട്ടം 2: Choose the scan resolution. There will be a window when entering the software interface, two types of scan resolution are selected depending on the users’ requirement, usually 256. Click “OK” shown in Figure 6.

ഘട്ടം 3: Electronics calibration. When the User installs the system first time or moves it, the User should do the electronics calibration. Also, it is recommended to do this every day. The user can open the electronics calibration as the following Figure 7, Click Microscope – Calibration – Electronics, and this is the electronics calibration window. Meanwhile, insert a black paper 8 into the scan head to block the laser path. Next, choose all three signal options in the Reset A/D panel, and click “Apply”. After it is finished, click ‘Ok ‘and close this window.

ഘട്ടം 4: Adjust the laser and position-sensitive detector: Install the tip holder loading tip in the scan head.

Click the quick icon “laser detector” ഐക്കണിൽ ക്ലിക്കുചെയ്യുക in the toolbar to start the laser detector. Adjust the laser point in the middle of the window box (laser adjustment method shown in chapter 8.5). Last, click the icon again to stop laser detection and close the window, see Figure 8.

Step 5: Search resonance frequency. Click the quick icon to open f-RMS curve windows; Set the vibration source amplitude as 0.01 or 0.1, then click to automatically search; After it is done, click to collect the f-RMS curve data, after an interval 3s, click again to finish data collection, as shown Figure 10.

ഘട്ടം 6: Select the system parameter. Click the quick icon to open the image window. Set the “Display size” as 10 nm and 1V, “Display mode” as “image + profile”, shown in Figure 11.

Then, click Microscope – Calibration – system parameter. The User can find the system parameter window, select the right parameter corresponding to the scanner. Click “save to current parameter document” and “OK” to close this window, as shown in Figure 12.

ഘട്ടം 7: Select image color. Click a quick icon to open the “color palette” window, User can set the image color at will. Usually set parameter: “select curve” as red, “select color palette” as 13, see Figure 13. After it is set, click Ok and close the window.

ഘട്ടം 8: Tip – sample approach. First, manually run the motor to drive the tip close to the sample. Figure 14. shows the approach motor icons.

When the tip approaches to sample at ~1 mm manually, switch to the auto approach. Click the quick icon to open the motor auto approach window and click the icon to set the approach parameter in the drop-down.
Set the value of “Approach- stop at “as 400-1000 nm, depending on different scanner types, while other parameters use the default value.

Then click “auto approach”, the tip will approach to sample automatically controlled by software. When the tip approaches to a proper position, the motor will stop automatically and show a window” already entered working area, motor stop”, Click Ok to end this step, see Figure 15.

ഘട്ടം 9: Observe the RMS-Z curve. After the tip approaches to sample and the motor stops automatically, the User can first observe the RMS-Z curve to check the tip status. (Note: this step is not essential if the status of the tip is normal after the tip approaches). Click the quick icon to open the RMS-Z curve window, then click the icon to observe the RMS-Z curve.

If the curve is as normal as that shown in Figure -16, that is OK; if not, kindly click icon to give an auto offset to the scan point or click the motor single step approach or motor single step withdraw, click the quick icon again to observe the RMS-Z curve. The user can repeat these steps until the User obtains a complete RMS-Z curve, just as in Figure 16, then close the window. The RMS-Z curve illustrates the relation between the amplitude of tip and the distance of the tip to the sample. The user can not only judge the status of the tip–sample reaction, but also the status of the tip.

ഘട്ടം 10: Image scanning. Click the icon to begin imaging, as Figure 17.

Gradually increase the scanning range, for example, from 0 -> 100 -> 500 -> 1000 -> 2000 -> 5000 nm, and observe the height hatch. Increase the display range in the height control panel depending on the Z height data of the section line peak situation. User can change other parameter values on the left side of the window to obtain clearer images. The meanings of the main parameters are explained in the following:

“ XY ratio”: This parameter is used to change the ratio of scanning points between X and Y directions.

“X” offset, “Y offset”: centre point offset in changed scanning position.
“ Scan angle”: Change the imaging angle of the sample.
“ Scan rate”: Change the scanning rate.
“I. Gain”, “P. Gain”: change the feedback rate of the system in scanning.

Meanwhile, learn the meaning and function of icons in tool toolbar.

ഐക്കണിൽ ക്ലിക്ക് ചെയ്യുക when scanning. The User will save the image data in the file of clip where the AFM software is installed: X:\AFM software\ TAFM\Data. Only the image that is finished can be saved automatically. After the full image is scanned, click the icon to stop imaging, as Figure 18.

User can change the save path of the image and the document name either before imaging or 17 – after setting it. Click “View” – “captured document name” in tool bar, there is a window for setting the save path and document name shown in Figure 19.

Step 11: Withdraw tip, shutdown AFM. After the scanning finishes, click the quick icon to open the motor auto-control panel, click “Withdraw” to withdraw the tip away from the sample, as Figure. 20. The tip will withdraw default steps and stop automatically, then the User should manually withdraw the tip >2mm away from the sample. Next, close the “motor auto-control” window, the software, and the main power of AFM successively.

Contact Mode AFM Operation Method

ഘട്ടം 1: Turn on the main power, then open the AFM software. Double-click the “AFM.exe” file to enter the contact mode AFM software.
Steps 2, 3, 4, 5, 6: Just the same as those of Tapping mode AFM step 2, 3, 4, 6, 7. (NO Step 5). Important information: The Contact mode tip should be used in contact mode AFM. (Method of changing tip referring to chapter 8.2).

ഘട്ടം 8: tip – sample approach. Before approaching, set the “set-point” as 1~0.9 V, as Figure 21. Other steps are the same as tapping mode AFM.

Step 9: Observe F-Z curve. After the tip approaches to sample and the motor stops auto. The user can first observe the F-Z curve to check the status of the tip-sample before scanning. Click the icon to open the F-Z curve window, then click the icon to test the F-Z curve. Compare the curve to thatin Figure 22. if it is not normal, click the icon to set scan point auto-offset, or click motor single step approach, or single step with draw. Next click to test the F-Z curve again. The user can repeat these steps until obtain a normal F-Z curve. At last, close the window. A good F-Z curve shows proper force between the tip and sample, corresponding to a good image.

ഘട്ടങ്ങൾ 10, 11: It is the same as that of tapping mode AFM.

Prepare and load the sample
If the User uses this AFM system first time. Users are recommended to use the attached sample of the Grid or DVD. To prepare other samples, install the samps ലെ leample holder with double-sided tape or other glue, then put the sample holder on the top of the scanner, which is magnetic.

Load tip in tip holder
The procedure for contact mode AFM tip installation is essentially the same as for tapping mode AFM. Figures 23 and 24 show the details. First, the substrate should be face-up with the probe groove up. This ensures that the tip is facing towards the sample once the tip holder is mounted in the scan head. Use elbow tweezers to hold the front part of the tip with proper force, meanwhile the other hand presses down the tip-holder with force to make the spring clip up, as Figure 23.

Then locate the tip flush against the inside edges of the groove carefully, withdraw the tweezers, and leave the spring clip back to hold the tip, as Figure 24. At last, put the tip holder into the dovetail groove of the scan head.

ലേസർ ക്രമീകരിക്കുക

The step 4th of tapping mode AFM and contact AFM operation, the User needs to adjust the laser after the tip changes.
Click quick icon to open the laser detector window. Then click icon to start laser detection, the laser detection function works. First adjust the laser adjustment knob to move the laser beam on the front of tip, as shown in Figure 24. Verify the laser beam is visible on the surface below and shaped as rings like a diffraction pattern, as shown in Figure 25.

Figure 27 shows the structure of scan head, there are two laser adjustment knobs (X, Y). Before User adjust the laser, twist he sample translation knob X to move the sample to the rightmost side and User can see a laser spot below to the left of scan head with a white paper on the table surface. Adjust the X/Y knobs, the laser beam will move in X/Y direction separately (Note: Normally User can see the laser diffraction ring by just adjusting the laser adjustment knob Y).

Then adjust the photodiode adjustment knob X/Y to check whether the laser is adjusted right. Users observe the laser pot when adjusting photodiode adjustment knob, if the laser energy changes a lot, it shows the laser is not located on the front of tip, User need to adjust the laser again. Otherwise, the laser is right on the tip front. At last, adjust the photodiode adjustment knob X/Y to locate the laser spot in the centre of laser detection widow. photodiode adjustment knob X/Y accordingly controls the laser spot to move horizontally and vertically. After the laser spot is located in the centre, click the icon to stop detection and close this window.

Use of CCD
This instrument provides a CCD observing system with optical magnification is 10x and a resolution reaches 1 μm. Users can observe the situation as the sample approaches the tip, and the scanning situation in real time. The system is also convenient for users to select an interesting sample area for scanning. A large NA objective is used that focuses on the cantilever, so the users do not need to adjust the focus. If the User wants to observe an area beyond of sample, the User can adjust the focus button on the panel of the controller box. Figure 28 shows the CCD buttons.

Use of the Sample translation stage
This system provides a sample micro-translation stage for looking for an interesting sample area, as shown in Figure 29. The sample translation stage can move in the X/Y direction using a precision micrometer head. The user should move the sample area before the tip approaches, together with the CCD observing system.

ട്രബിൾഷൂട്ടിംഗ്

പ്രശ്നം	സാധ്യമായ കാരണം	പരിഹാരം
Image Drift and Bend	1) System regulation is not normal. 2) Unstable system environment. 3) Sample preparation does not meet the requirements. 4) The experimental environment does not meet the requirements.	1) First, check the boot of the instrument, whether the debugging process corresponds to specifications, and whether the connector and patch are well. 2) In general, turn on the system and warm it for more than 30 minutes, and the instrument can reach thermal stability. 3) Check whether the sample preparation is according to requirements, the flatness of the substrate, sample flatness, cleanliness of the substrate, and the sample. 4) Whether the environment is quiet enough and shock resistant, the humidity of the environment cannot be too high.
Some lines in the Image	1) AFM contact mode interaction is not enough. 2) The scanning speed is too fast. 3) The feedback cannot keep up.	1) Increase the value of the set point. 2) Reduce the scanning speed; the scanning speed is generally recommended of 0.5 ~ 1.0 Hz. 3) Increase the feedback speed, increasing the integration parameters, the general principle is in non-resonant case, try to increase the integral value to maintain the feedback speed fast enough.
ഒന്നിലധികം structures or repeated structures in the image.	Double-tip or multi-tip effects.	നുറുങ്ങ് മാറ്റിസ്ഥാപിക്കുക.
The image is in black or white.	1) Z drift of the scanner goes beyond of range. 2) Real-time image processing options. 3) The surface roughness of the sample is too large.	1) Check whether the voltage of the Z direction is in the normal range and adjust the Z voltagഇ സാധാരണ നിലയിലേക്ക്. 2) In general, select “Line Average” in real-time image processing. 3) Replace the scanning area or the sample.

How to set the setpoint in contact mode AFM?
It is a feedback parameter in the control system to adjust the force in contact mode AFM. It is usually set as —1~-.0.1. Its absolute value indicates the force of reaction between the sample and tip; a higher value indicates, stronger force.

How to choose different test modes?
Hard surface samples are to be tested with Contact mode AFM, soft samples or biological samples should be tested in Dynamic force mode AFM. Most of the samples are applied to the Tapping AFM. If users need high resolution, use Contact AFM.

ലാബ്മേറ്റ് സയന്റിഫിക് ഇൻക്
ഇമെയിൽ: info@labmate.com

Webസൈറ്റ്: www.labmate.com

പതിവുചോദ്യങ്ങൾ

എന്താണ് എസ്amples are supported by Atomic Force Microscope LMAFM-A101?

The microscope supports nanometer-level imaging of graphite,gold clusters, polystyrene spheres, and polysaccharides.

How do I adjust the laser and position-sensitive detector?

Install the tip holder loading tip in the scan head, start the laser detector, adjust the laser point, and close the window as instructed in the manual.

പ്രമാണങ്ങൾ / വിഭവങ്ങൾ

Labmate LMAFM-A101 Atomic Force Microscope [pdf] നിർദ്ദേശ മാനുവൽ
LMAFM-A101 Atomic Force Microscope, LMAFM-A101, Atomic Force Microscope, Force Microscope, Microscope

റഫറൻസുകൾ

ഉപയോക്തൃ മാനുവൽ

Labmate LMAFM-A101 Atomic Force Microscope

ഉൽപ്പന്ന ഉപയോഗ നിർദ്ദേശങ്ങൾ